| Mfg Part Number: 15-1326286-1 | Alternate P/N: 1513262861 | Manufacturer: Gte Communication Systems Corp |
| NSN : 5962-01-375-7492 | NIIN : 013757492 | Item Name : Microcircuit Memory |
| CAGE Code : 0BDC6 | FSC : 5962 Microcircuits Electronic |
Thank you for taking an interest in the various military NSN parts and aerospace parts we offer on our website. You have currently taken interest in part number 15-1326286-1, a Gte Communication Systems Corp item produced under CAGE Code 0BDC6. For further identification purposes, part number 15-1326286-1 is also listed with the NSN 5962013757492, and it is organized under Federal Supply Class (FSC) 5962 Microcircuits Electronic for ease of procural. By filling out and submitting the form provided below, you will be able to receive purchasing options on this item directly from our staff. For us to best tailor our presented solution to your unique needs and restrictions alike, we ask that you please offer our team details like your desired quantity, target pricing, and expected fulfillment timeframe. We can even accommodate many time constraints and limitations that customers may face, so be sure to let us know of any requests when you submit an RFQ form for part number 15-1326286-1.
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| NSN | FSC | NIIN | CLS | Hazmat | DEMIL | Cancelled NSN |
|---|---|---|---|---|---|---|
| 5962-01-375-7492 Item Description: Microcircuit Memory | 5962 | 013757492 | 0 | N | B | |
| CIIC | HCC | ESD | PMIC | Criticality | ENAC | |
| 7 | B | A | 0 | |||
| Part Number | ISC | RNVC | RNCC | HCC | MSDS | SADC |
| 15-1326286-1 | 5 | 2 | 5 |
| MRC | Criteria | Characteristic |
|---|---|---|
| AGAV | End Item Identification | HAC/RMPE REACT BASIC |
| NHCF | Nuclear Hardness Critical Feature | HARDENED |
| CZZZ | Memory Capacity | 128K X 8 |
| CTQX | Current Rating Per Characteristic | 5.00 MICROAMPERES MAXIMUM INPUT |
| CBBL | Features Provided | BURN IN, MIL-STD-883, CLASS B AND ELECTROSTATIC SENSITIVE AND MONOLITHIC AND RADIATION HARDENED AND ULTRAVIOLET ERASABLE AND TESTED TO MIL-STD-883 AND SELECTED ITEM |
| CZER | Memory Device Type | EPROM |
| AFJQ | Storage Temp Range | -65.0/+150.0 DEG CELSIUS |
| TEST | Test Data Document | 96906-MIL-STD-883 STANDARD (INCLUDES INDUSTRY OR ASSOCIATION STANDARDS, INDIVIDUAL MANUFACTUREER STANDARDS, ETC.). |
| ADAT | Body Width | 0.585 INCHES MINIMUM AND 0.605 INCHES MAXIMUM |
| FEAT | Special Features | ELECTROSTATIC DISCHARGE SENS/HARDNESS CRITICAL ITEM; SELECTED ITEM; SELECTED FROM P/N 5962-8961404MXX OR 5962-8961405MXX,CAGE 67268 |
| SPCL | Special Test Features | SELECTED AND TESTED FOR RADIATION HARDNESS |
| CQSZ | Inclosure Configuration | DUAL-IN-LINE |
| ADAQ | Body Length | 1.660 INCHES MINIMUM AND 1.680 INCHES MAXIMUM |
| AEHX | Maximum Power Dissipation Rating | 330.0 MILLIWATTS |
| ADAU | Body Height | 0.200 INCHES MINIMUM AND 0.220 INCHES MAXIMUM |
| CZEN | Voltage Rating And Type Per Characteristic | -0.6 VOLTS MINIMUM TOTAL SUPPLY AND 7.0 VOLTS MAXIMUM TOTAL SUPPLY |
| TTQY | Terminal Type And Quantity | 32 PRINTED CIRCUIT |
| CQSJ | Inclosure Material | CERAMIC |
| CXCY | Part Name Assigned By Controlling Agency | MICROCIRCUIT,PROM,128K X 8 (27C010); MICROCIRCUIT,MEMORY DIGITAL,CMOS 128K X 8-BIT UVEPROM,MONOLITHIC SILICON |
| MRC | Decoded Requirement | Clear Text Reply |
| AFGA | Operating Temp Range | -55.0/+125.0 DEG CELSIUS |
| CWSG | Terminal Surface Treatment | SOLDER |
| CZEQ | Time Rating Per Chacteristic | 150.00 NANOSECONDS MINIMUM ACCESS AND 170.00 NANOSECONDS MAXIMUM ACCESS |
| CQWX | Output Logic Form | COMPLEMENTARY-METAL OXIDE-SEMICONDUCTOR LOGIC |
| CRTL | Criticality Code Justification | FEAT |
| 15-00-7666 | 15-00-28 | 15-00-9068 | 15-00-9152 |
| 15-0-4 | 15-000110 | 15-00018 | 15-0003647-001 |
| 15-0003649 | 15-00018 | 15-00-01-85193 | 15-0003-7 |
| 15-000-037-000 | 15-0003-5-1495 | 15-00035-005 | 15-0003651 |
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